NYIT School of Engineering and Computing Sciences’ Research Experience for Undergraduates (REU) participants have been keeping busy this summer with hands-on research activities and field trips to relevant technology sites in New York City. The REU program is a 10-week NSF-funded research experience for undergraduate students at colleges and universities across the U.S. NYIT’s REU site, “ provides opportunities for 10 motivated and talented undergraduate students to collaborate with NYIT faculty and graduate students in research on methods of securing smartphones and their networks using both hardware and software approaches.
The 10 REU students recently went on tours to the Research and Development labs and offices at Motorola and AT&T here in New York, where they gained valuable exposure to applied research labs in the smartphone industry, and engaged in relevant research discussions with high-level professionals in the field of mobile device security and wireless networks.
At Motorola, the REU participants got a close-up look at the R&D offices and innovation labs, and toured the Motorola Solution Centers and Design Lab. While there, they sat in on two seminars on security in mobile devices, specifically in their payment and wireless systems. Later, at the AT&T Security Research Center, REU students toured the lab and received a demo of the new LTE testbed, and participated in a research talk with professional researchers on various topics like wireless network security, malware detection, encryption techniques, and case studies done by AT&T.
This year’s REU students are Chris DelBello of Loyola University, Arban Nichols of York College, CUNY, Christopher Piekarski of NYIT, Peter Story of Gordon College, Christie Yeh of Gordon College, Wendy Rummerfield of University of Redlands, Ido Shoshani of Lewis and Clark College, Gabriela Llave of University of Central Florida, and Luis Shinin of NYIT.
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